List of Invited Talks at International Conferences (Fiscal 2002)
I. Device Physics
(1) H. Kageshima, A. Taguchi, and K. Wada, gTheoretical investigation of nitrogen-doping effect on native defect aggregationh, MRS Spring Meeting, San Francisco, USA (Apr. 2002). (2) S. Uematsu, gprocesses in silicon simulation of transient enhanced diffusion in silicon taking into account Ostwald ripening of defectsh, MRS Spring Meeting, San Francisco, USA (May 2002). (3) Y. Takahashi, Y. Ono, S. Fujiwara and H. Inokawa, gSilicon single-electorn transistors and their applications to logich, Electorochemical Society Spring Meeting 2002, Philadelphia, USA (May 2002). (4) S. Uematsu, H. Kageshima and K. Shiraishi, gUnified theory of silicon oxide growthh, Electorochemical Society Spring Meeting 2002, Philadelphia, USA (May 2002). (5) T. Ogino, Y. Homma, Y. Kobayashi, H. Hibino, P. Kuniyil, K. Sumitomo, H. Omi, D. Bottomley, A. Kaneko and F. Lin, gIntegration of semiconductor nanostructures and interconnections of future self-assembled nanoarchitectureh, Electorochemical Society Spring Meeting 2002, Philadelphia, USA (May 2002). (6) T. Ogino, Y. Homma, Y. Kobayashi, H. Hibino, P. Kuniyil, K. Sumitomo and H. Omi, gControl of nanostructure self-assembly by atomic-structure and strain engineeringh, IUVSTA Workshop, Trofaiach, Austria (Jun. 2002). (7) Y. Watanabe, S. Suzuki, T. Ogino and S. Heun, gSpectromicroscopy of carbon nanotubesh, E-MRS, Strasbourg, France (Jun. 2002). (8) T. Ogino, Y. Homma, Y. Kobayashi and H. Hibino, gAtomic-structure and strain engineering for control of self-organized Ge quantum nanostructuresh, E-MRS, Strasbourg, France (Jun. 2002). (9) A. Fujiwara and Y. Takahashi, gSi nano-devices using an electron-hole systemh, 5th European Workshop on Low Temperature Electronics (WOLTE-5), Grenoble, France (Jun. 2002). (10) P. Kuniyil and T. Ogino, gSynthesis of Nanomagnets on Semiconductor Surfacesh, Int. Conf. Comp. Eng., San Diego, USA (Jul. 2002). (11) Y. Takahashi, Y. Ono, A. Fujiwara and H. Inokawa, gSilicon single-electron devicesh, Euro. Sol. Stat. Circ. Conf., Firenze, Italy (Sep. 2002). (12) A. Fujiwara and Y. Takahashi, gSingle-charge detection and manipulation in a Si nanowireh, Int. Conf. on Semiconductor Quantum Dots (QD2002), Tokyo, Japan (Sep. 2002). (13) Y. Takahashi, gSilicon single-electronicsh, The 3rd Workshop for Terabit-level Nano-Electronics, Cheongju, Korea (Oct. 2002). (14) H. Kageshima, S. Uematsu and K, Shiraishi, gSi injection model for the Si thermal oxidationh, 5th Asian Workshop on First-Principles Calculation, Seoul, Korea (Oct. 2002). (15) P. Kuniyil and T. Ogino, gVersatile functionality to silicon by nanoparticle incorporationh, Nanoparticles 2002, New York, USA (Oct. 2002). (16) T. Ogino, Y. Homma, Y. Kobayashi, H. Hibino, P. Kuniyil, K. Sumitomo, H. Omi and Z. Zhang, gStrain engineering for control of Ge quantum nanostructures on Si surfacesh, The 10th international Colloquim on SPM, Waikiki, USA (Oct. 2002). (17) Y. Homma, H. Takenaka, F. Tojou, S. Hayashi, N. Goto, M. Inoue and R. Shimizu, gEvaluation of BN-delta-doped multilayers as the reference material for SIMS shallow depth profilingh, The 2nd China-Japan Joint Seminar on Atomic Level Characterization, Guillin, China (Nov. 2002). (18) T. Yamaguchi, K. Yamazaki, M. Nagase and H. Namatsu, gLine-edge roughness: Characterization and material originh, MNC2002, Tokyo, Japan (Nov. 2002). (19) S. Suzuki, Y. Watanabe, T. Ogino and S. Huen, gPhotoemission spectromicroscopy of carbon nanotubesh, 2nd Int. Workshop on Nano-scale Spectroscopy and Nanotechnology, Tokyo, Japan (Nov. 2002). (20) Y. Watanabe, S. Suzuki, T. Ogino, S. Huen, L. Gregoratti, A. Barinov, B. Kaulich, M. Kiskinova, W. Zhu, C. Bower and O. Zhou, gElectronic properties of carbon nanotubes studied by photoemission spectroscopy and spectromicroscopyh, Int. Symp. on photoelectron micro-PES, Tsukuba, Japan (Dec. 2002). (21) Y. Takahashi, Y. Ono, A. Fujiwara and H. Inokawa, gDevelopment of silicon single-electron devicesh, Nano MES 2003, Tempe, USA (Feb. 2003). (22) P. Kuniyil, gNanoparticles as potential candidates for bottom-up approachh, JSPS-DST Symposium, Tokyo, Japan (Mar. 2003).