List of Invited Talks at International Conferences (Fiscal 2003)
I. Device Physics
(1) Y. Takahashi, Y. Ono, S. Fujiwara, and H. Inokawa, gDevelopment of silicon single-electron devicesh, The 4th International Symposium on Nanostructures and Mesoscopic Systems (NanoMES2003), Tempe, USA (Feb. 2003). (2) Y. Homma, gIn situ observations using ultrahigh vacuum scanning electron microscopyh, Microscopy and Microanalysis, San Antonio, USA (Aug. 2003). (3) Y. Homma, gSelf-assembled nanotube networks for nano-device applicationsh, 4th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALCf03), Hawaii, USA (Oct 2003). (4) S. Suzuki, Y. Watanabe, Y. Homma, T. Ogino, S. Heun, L. Gregoratti, A. Brinov, B. Kaulich, and M. Kiakinova, gPhotoemission spectromicroscopy and spectroscopy of carbon nanotubesh, AVS international Symposium, Baltimore, USA (Nov 2003). (5) Y. Takahashi, S. Fujiwara, and S. Horiguchi, gSilicon nano-wire and quantized conductanceh, International workshop on smart interconnects, Atami, Japan (Nov. 2003). (6) H. Hibino, Y. Homma, C.-W. Hu, M. Uwaha, T. Ogino, and I. S. T. Tsong, gStructural and morphological changes on surface with multiple phases studied by low-energy electron microscopyh, 7th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-7), Nara, Japan (Nov. 2003). (7) Y. Takahashi, Y. Ono, S. Fujiwara, K. Nishiguchi, and H. Inokawa, gSilicon single-electron devices operating with MOSFETsh, Sixth International Conference on New Phenomena, Maui, USA. (Dec. 2003). (8) Y. Watanabe, S. Suzuki, Y. Homma, and T. Ogino, gSpectromicroscopy of carbon nanotubesh, 2nd Int. Conf. on Materials for Advanced Technology, Singapore (Dec. 2003). (9) Y. Takahashi, Y. Ono, S. Fujiwara, K. Nishiguchi, and H. Inokawa, gSilicon nano-devices and single-electron devicesh, 2003 International Semiconductor Device Research Symposium (ISDRS2003), Washington D.C., USA (Dec. 2003). (10) Y. Homma, gSuspended carbon nanotube architectures: growth control and optical propertiesh, 12th International Conference on Advanced Materials and Devices 2003, Jeju island, Korea (Dec. 2003). (11) Y. Watanabe, B. Satyaban, T. Kawamura, S. Fujikawa, and N. Yamamoto, gGrowth and Characterization of Vertically Aligned InP Nanowires on Semiconductor Substratesh, 12th Int. Workshop the Physics of Semicond. Dev., Chennai, India (Dec. 2003). (12) Y. Watanabe, gInP nanowire growth on semiconducting materials by metal organic vapor phase epitaxyh, Int. Conference on Nano Science and Technology, Kalkata, India (Dec. 2003).