Time-Resolved X-ray Absorption Measurement of Optically Excited Silicon by Pump-Probe Spectroscopy using Femtosecond Laser-Plasma X-rays

High density plasma created near the solid surface by a femtosecond laser pulse emits ultrashort X-ray pulse. Utilizing ultrashort X-ray pulse from femtosecond laser-produced plasma, we demonstrated time-resolved X-ray absorption measurement of optically excited silicon by means of pump-probe spectroscopy.