Time-Resolved X-ray Absorption Measurement
of Optically Excited Silicon by Pump-Probe
Spectroscopy using Femtosecond Laser-Plasma
X-rays
High density plasma created near the solid
surface by a femtosecond laser pulse emits
ultrashort X-ray pulse. Utilizing ultrashort
X-ray pulse from femtosecond laser-produced
plasma, we demonstrated time-resolved X-ray
absorption measurement of optically excited
silicon by means of pump-probe spectroscopy.
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