国際会議招待講演一覧 (2002年度)

I. デバイス物理関連

(1) H. Kageshima, A. Taguchi, and K. Wada, “Theoretical investigation of nitrogen-doping effect on native defect aggregation”, MRS Spring Meeting, San Francisco, USA (Apr. 2002).
(2) S. Uematsu, “Processes in silicon simulation of transient enhanced diffusion in silicon taking into account Ostwald ripening of defects”, MRS Spring Meeting, San Francisco, USA (May 2002).
(3) Y. Takahashi, Y. Ono, S. Fujiwara and H. Inokawa, “Silicon single-electorn transistors and their applications to logic”, Electorochemical Society Spring Meeting 2002, Philadelphia, USA (May 2002).
(4) S. Uematsu, H. Kageshima and K. Shiraishi, “Unified theory of silicon oxide growth”, Electorochemical Society Spring Meeting 2002, Philadelphia, USA (May 2002).
(5) T. Ogino, Y. Homma, Y. Kobayashi, H. Hibino, P. Kuniyil, K. Sumitomo, H. Omi, D. Bottomley, A. Kaneko and F. Lin, “Integration of semiconductor nanostructures and interconnections of future self-assembled nanoarchitecture”, Electorochemical Society Spring Meeting 2002, Philadelphia, USA (May 2002).
(6) T. Ogino, Y. Homma, Y. Kobayashi, H. Hibino, P. Kuniyil, K. Sumitomo and H. Omi, “Control of nanostructure self-assembly by atomic-structure and strain engineering”, IUVSTA Workshop, Trofaiach, Austria (Jun. 2002).
(7) Y. Watanabe, S. Suzuki, T. Ogino and S. Heun, “Spectromicroscopy of carbon nanotubes”, E-MRS, Strasbourg, France (Jun. 2002).
(8) T. Ogino, Y. Homma, Y. Kobayashi and H. Hibino, “Atomic-structure and strain engineering for control of self-organized Ge quantum nanostructures”, E-MRS, Strasbourg, France (Jun. 2002).
(9) A. Fujiwara and Y. Takahashi, “Si nano-devices using an electron-hole system”, 5th European Workshop on Low Temperature Electronics (WOLTE-5), Grenoble, France (Jun. 2002).
(10) P. Kuniyil and T. Ogino, “Synthesis of Nanomagnets on Semiconductor Surfaces”, Int. Conf. Comp. Eng., San Diego, USA (Jul. 2002).
(11) Y. Takahashi, Y. Ono, A. Fujiwara and H. Inokawa, “Silicon single-electron devices”, Euro. Sol. Stat. Circ. Conf., Firenze, Italy (Sep. 2002).
(12) A. Fujiwara and Y. Takahashi, “Single-charge detection and manipulation in a Si nanowire”, Int. Conf. on Semiconductor Quantum Dots (QD2002), Tokyo, Japan (Sep. 2002).
(13) Y. Takahashi, “Silicon single-electronics”, The 3rd Workshop for Terabit-level Nano-Electronics, Cheongju, Korea (Oct. 2002).
(14) H. Kageshima, S. Uematsu and K, Shiraishi, “Si injection model for the Si thermal oxidation”, 5th Asian Workshop on First-Principles Calculation, Seoul, Korea (Oct. 2002).
(15) P. Kuniyil and T. Ogino, “Versatile functionality to silicon by nanoparticle incorporation”, Nanoparticles 2002, New York, USA (Oct. 2002).
(16) T. Ogino, Y. Homma, Y. Kobayashi, H. Hibino, P. Kuniyil, K. Sumitomo, H. Omi and Z. Zhang, “Strain engineering for control of Ge quantum nanostructures on Si surfaces”, The 10th international Colloquim on SPM, Waikiki, USA (Oct. 2002).
(17) Y. Homma, H. Takenaka, F. Tojou, S. Hayashi, N. Goto, M. Inoue and R. Shimizu, “Evaluation of BN-delta-doped multilayers as the reference material for SIMS shallow depth profiling”, The 2nd China-Japan Joint Seminar on Atomic Level Characterization, Guillin, China (Nov. 2002).
(18) T. Yamaguchi, K. Yamazaki, M. Nagase and H. Namatsu, “Line-edge roughness: Characterization and material origin”, MNC2002, Tokyo, Japan (Nov. 2002).
(19) S. Suzuki, Y. Watanabe, T. Ogino and S. Huen, “Photoemission spectromicroscopy of carbon nanotubes”, 2nd Int. Workshop on Nano-scale Spectroscopy and Nanotechnology, Tokyo, Japan (Nov. 2002).
(20) Y. Watanabe, S. Suzuki, T. Ogino, S. Huen, L. Gregoratti, A. Barinov, B. Kaulich, M. Kiskinova, W. Zhu, C. Bower and O. Zhou, “Electronic properties of carbon nanotubes studied by photoemission spectroscopy and spectromicroscopy”, Int. Symp. on photoelectron micro-PES, Tsukuba, Japan (Dec. 2002).
(21) Y. Takahashi, Y. Ono, A. Fujiwara and H. Inokawa, “Development of silicon single-electron devices”, Nano MES 2003, Tempe, USA (Feb. 2003).
(22) P. Kuniyil, “Nanoparticles as potential candidates for bottom-up approach”, JSPS-DST Symposium, Tokyo, Japan (Mar. 2003).


【前ページ】 【目次へもどる】 【次ページ】