This is my poster presentaion for IVC-17/ICSS-13 and ICN+T2007 2007.7.2, Stockholm International Fairs, Stockholm, Sweden)

Title:

Local conductance measurement of few-layer graphene on SiC substrate using an integrated nanogap probe

Authors:

M. Nagase, H. Hibino, H. Kageshima and H. Yamaguchi

Contents:

[Title]

[Abstract]

[Introduction]
{Nanometrology}
{Nanotool -Integrated nanoprobe-}
{Nanomaterial -Graphene-}

[Previous results (ICN+T2006)]

[Experimental Setup]
{Nanogap Probe on SPM}
{Thickness determination of thermally grown graphene using LEEM}
{LEEM images of annealed SiC substrate}
{Single and double layer graphene on SiC}

[Conductance of nanographene]
[Conductance of nanographene]
{Micrographs of graphene on SiC}
{Conductance image of graphene on SiC}
{Conductance of single- and double-layer graphene nanoislands}

[Summary]

If you have any question or comment, please mail to nagase.

HOME PAGE of NTT Basic Res. Labs.

upload :2007/7/10

------------------------------------

(c) NTT Basic Research Laboratories

------------------------------------