ICSPM14 poster

This is my poster presentaion for ICSPM14 (14th International Colloquium on Scanning Probe Microscopy: 2006.7.31, Atagawa Heights, Japan)

Title:

Local conductance imaging of nanomaterials on insulator using an integrated nanogap probe

Authors:

M. Nagase and H. Yamaguchi

Abstract:
We have developed a new SPM-based tool, that enables us to make local in-plane conductance measurements using a split electrode (nanogap) probe. The nanogap was fabricated using focused ion beam (FIB) milling integrated on a Si cantilever. The integrated nanotool can be used for two-terminal conductance measurements of a wide variety of nanostructures. An investigation of electronic transport in isolated nanostructures, such as quantum dots and single molecules on an insulator substrate is one of our important targets, because these structures will be basic elements in future electronic devices. In this paper, we report on the results of in-plane conductance measurements using the integrated nanogap probe for InAs nanowires grown on a GaAs substrate.

Contents:

[Title]

[Introduction]
{Integrated Nanoprobe}

[Previous Results]
{Four-point Nanoprobe System Fabricated by FIB Milling with Selfdetective Sensors}
{Four-point Nanoprobe Fabricated Using Ion Beam Nanolithography}

[Fabrication of Nanogap Probe]
{Gap Electrode Fabricated Using FIB}
{Nanogap Probe on Si Cantilever}

[Experimental Setup]
{Nanogap Probe on SPM}

[Results for Nano-materials]
{Local Conductance Image of InAs Nanowire}
{Conductance Characteristics of InAs Nanowire}
{Local Conductance in InAs Nanowire}

[Summary]

Handout of this presentation is HERE.

If you have any question or comment, please mail to nagase.

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upload :2007/2/13

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