This is my poster presentaion for SNW2005 (2005 Silicon Nanoelectronics Workshop, June 13, 2005, Rihga Royal Hotel Kyoto, Kyoto, Japan).

Imaging of Nano-scale Embedded Dislocation Networks in Si Bicrystal

Masao Nagase, Yasuhiko Ishikawa*, Yukinori Ono and Michiharu Tabe*
*Research Institute of Electronics, Shizuoka Univ.


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[Title]

[INTRODUCTION]
Introduction
Previous work on Si bicrystal
Nanoscale imaging using EBIC effect

[RESULTS]
Experimental conditions
Images of Si bicrystal
Measurement of bonding angles
Image of embedded dislocations
SNDM results of bicrystal


[Summary]

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upload :2005/7/27

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