Medium Energy Ion Scattering
Japanese version is [here].
Advantages
- Quantitative Analysis of Atomic Displacement: sub-Angstrom
order
- Double Alignemnt: Channeling and Blocking
- High Energy-Resolution (Electrostatic analyzer)
- Depth Resolution: Angstrom order
Mass Resolution: Ga and As peaks are clearly resolved
- Structure analysis of embedded interface (not only topmost
surface)
Angle
Resolved Ion Detection in MEIS
Typical operation condition
- Probe ion: proton and Helium
- Primary Energy: between 50 and 350 keV
- Electrostatic analyzer: 340 eV resolution for 100 keV
proton
- Detector: Position sensitive MCP (angle resolution: 0.1
deg.)
Go back to Surface Science Research Group
Home Page.
Koji Sumitomo
/ sumitomo@will.brl.ntt.co.jp