Growth and synthesis of thin films

MBE system for growing complex oxide thin films x 4

Ion-beam-assisted MBE system for nitride thin films x 1

Structural Characterization

Bruker D2 PHASER X-ray diffractometer x 2

Bruker D8 DISCOVER X-ray diffractometer

Bruker XRD equipped with METALJET D2 PLUS

JEOL JEM-ARM200F Scanning TEM

Bruker Dimension FastScan AFM

Electrical & Magnetic Characterization

Dipping-type ρ(T) measurement system

Quantum Design PPMS with DYNACOOL

Quantum Design SQUID-VSM MPMS